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Journal Of Electronic Testing-theory And ApplicationsSCIE

国际简称：J ELECTRON TEST 参考译名：电子测试理论与应用杂志

中科院分区
4区
CiteScore分区
Q3
JCR分区
Q4

基本信息：: ISSN：0923-8174; E-ISSN：1573-0727; 是否OA：未开放; 是否预警：否; TOP期刊：否

出版信息：: 出版地区：UNITED STATES; 出版商：Springer US; 出版语言：English; 出版周期：Bimonthly; 出版年份：1990; 研究方向：工程：电子与电气-工程技术

评价信息：: 影响因子：1.1; H-index：31; CiteScore指数：2; SJR指数：0.271; SNIP指数：0.518

发文数据：: Gold OA文章占比：9.56%; 研究类文章占比：100.00%; 年发文量：43; 自引率：0.1111...; 开源占比：0.047; 出版撤稿占比：0; 出版国人文章占比：0; OA被引用占比：0.0092...

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英文简介期刊介绍 CiteScore数据中科院SCI分区 JCR分区发文数据常见问题

英文简介Journal Of Electronic Testing-theory And Applications期刊介绍

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

Testing of VLSI devices printed circuit boards, and electronic systems;

Testing of analog and digital electronic circuits;

Testing of microprocessors, memories, and signal processing devices;

Fault modeling;

Test generation;

Fault simulation;

Testability analysis;

Design for testability;

Synthesis for testability;

Built-in self-test;

Test specification;

Fault tolerance;

Formal verification of hardware;

Simulation for verification;

Design debugging;

AI methods and expert systems for test and diagnosis;

Automatic test equipment (ATE);

Test fixtures;

Electron Beam Test Systems;

Test programming;

Test data analysis;

Economics of testing;

Quality and reliability;

CAD Tools;

Testing of wafer-scale integration devices;

Testing of reliable systems;

Manufacturing yield and design for yield improvement;

Failure mode analysis and process improvement

期刊简介Journal Of Electronic Testing-theory And Applications期刊介绍

《Journal Of Electronic Testing-theory And Applications》自1990出版以来，是一本工程技术优秀杂志。致力于发表原创科学研究结果，并为工程技术各个领域的原创研究提供一个展示平台，以促进工程技术领域的的进步。该刊鼓励先进的、清晰的阐述，从广泛的视角提供当前感兴趣的研究主题的新见解，或审查多年来某个重要领域的所有重要发展。该期刊特色在于及时报道工程技术领域的最新进展和新发现新突破等。该刊近一年未被列入预警期刊名单，目前已被权威数据库SCIE收录，得到了广泛的认可。

该期刊投稿重要关注点：

预计审稿时间：较慢,6-12周
工程技术
ENGINEERING, ELECTRICAL & ELECTRONIC
SCIE
中科院4区
非预警

Cite Score数据（2024年最新版）Journal Of Electronic Testing-theory And Applications Cite Score数据

CiteScore：2
SJR：0.271
SNIP：0.518

学科类别	分区	排名	百分位
大类：Engineering 小类：Electrical and Electronic Engineering	Q3	495 / 797	37%

CiteScore 是由Elsevier(爱思唯尔)推出的另一种评价期刊影响力的文献计量指标。反映出一家期刊近期发表论文的年篇均引用次数。CiteScore以Scopus数据库中收集的引文为基础，针对的是前四年发表的论文的引文。CiteScore的意义在于，它可以为学术界提供一种新的、更全面、更客观地评价期刊影响力的方法，而不仅仅是通过影响因子(IF)这一单一指标来评价。

历年Cite Score趋势图

中科院SCI分区Journal Of Electronic Testing-theory And Applications 中科院分区

中科院 2023年12月升级版 综述期刊：否 Top期刊：否

大类学科	分区	小类学科	分区
工程技术	4区	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气	4区

中科院分区表 是以客观数据为基础，运用科学计量学方法对国际、国内学术期刊依据影响力进行等级划分的期刊评价标准。它为我国科研、教育机构的管理人员、科研工作者提供了一份评价国际学术期刊影响力的参考数据，得到了全国各地高校、科研机构的广泛认可。

中科院分区表 将所有期刊按照一定指标划分为1区、2区、3区、4区四个层次，类似于“优、良、及格”等。最开始，这个分区只是为了方便图书管理及图书情报领域的研究和期刊评估。之后中科院分区逐步发展成为了一种评价学术期刊质量的重要工具。

历年中科院分区趋势图

JCR分区Journal Of Electronic Testing-theory And Applications JCR分区

2023-2024 年最新版

按JIF指标学科分区	收录子集	分区	排名	百分位
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q4	278 / 352	21.2%

按JCI指标学科分区	收录子集	分区	排名	百分位
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q4	293 / 354	17.37%

JCR分区的优势在于它可以帮助读者对学术文献质量进行评估。不同学科的文章引用量可能存在较大的差异，此时单独依靠影响因子(IF)评价期刊的质量可能是存在一定问题的。因此，JCR将期刊按照学科门类和影响因子分为不同的分区，这样读者可以根据自己的研究领域和需求选择合适的期刊。

历年影响因子趋势图

本刊中国学者近年发表论文

1、A Layout-Based Rad-Hard DICE Flip-Flop Design
Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, Vol., , DOI:10.1007/s10836-019-05773-4
2、A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs
Author: Yanyan Gao, Xi Li

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 685-695, DOI:10.1007/s10836-013-5406-8
3、Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 849-859, DOI:10.1007/s10836-013-5415-7
4、An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis
Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 555-565, DOI:10.1007/s10836-013-5382-z
5、Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Author: Lung-Jen Lee

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 625-634, DOI:10.1007/s10836-013-5404-x
6、Prognostics of Analog Filters Based on Particle Filters Using Frequency Features
Author: Min Li, Weiming Xian, Bing Long, Houjun Wang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 567-584, DOI:10.1007/s10836-013-5383-y
7、A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors
Author: Bing Hou, Tong Liu, Jun Liu, Junli Chen, Faxin Yu, Wenbo Wang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 649-652, DOI:10.1007/s10836-016-5613-1
8、Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits
Author: Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, Vol.32, 97-103, DOI:10.1007/s10836-015-5559-8