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Ieee Transactions On Microwave Theory And Techniques

Ieee Transactions On Microwave Theory And TechniquesSCIE

国际简称:IEEE T MICROW THEORY  参考译名:IEEE 微波理论与技术汇刊

  • 中科院分区

    1区

  • CiteScore分区

    Q1

  • JCR分区

    Q2

基本信息:
ISSN:0018-9480
E-ISSN:1557-9670
是否OA:未开放
是否预警:否
TOP期刊:是
出版信息:
出版地区:UNITED STATES
出版商:Institute of Electrical and Electronics Engineers Inc.
出版语言:English
出版周期:Monthly
出版年份:1963
研究方向:工程技术-工程:电子与电气
评价信息:
影响因子:4.1
H-index:175
CiteScore指数:8.6
SJR指数:1.633
SNIP指数:1.696
发文数据:
Gold OA文章占比:10.97%
研究类文章占比:99.83%
年发文量:593
自引率:0.1860...
开源占比:0.1145
出版撤稿占比:0
出版国人文章占比:0.21
OA被引用占比:0
英文简介 期刊介绍 CiteScore数据 中科院SCI分区 JCR分区 发文数据 常见问题

英文简介Ieee Transactions On Microwave Theory And Techniques期刊介绍

The IEEE Transactions on Microwave Theory and Techniques focuses on that part of engineering and theory associated with microwave/millimeter-wave components, devices, circuits, and systems involving the generation, modulation, demodulation, control, transmission, and detection of microwave signals. This includes scientific, technical, and industrial, activities. Microwave theory and techniques relates to electromagnetic waves usually in the frequency region between a few MHz and a THz; other spectral regions and wave types are included within the scope of the Society whenever basic microwave theory and techniques can yield useful results. Generally, this occurs in the theory of wave propagation in structures with dimensions comparable to a wavelength, and in the related techniques for analysis and design.

期刊简介Ieee Transactions On Microwave Theory And Techniques期刊介绍

《Ieee Transactions On Microwave Theory And Techniques》自1963出版以来,是一本工程技术优秀杂志。致力于发表原创科学研究结果,并为工程技术各个领域的原创研究提供一个展示平台,以促进工程技术领域的的进步。该刊鼓励先进的、清晰的阐述,从广泛的视角提供当前感兴趣的研究主题的新见解,或审查多年来某个重要领域的所有重要发展。该期刊特色在于及时报道工程技术领域的最新进展和新发现新突破等。该刊近一年未被列入预警期刊名单,目前已被权威数据库SCIE收录,得到了广泛的认可。

该期刊投稿重要关注点:

Cite Score数据(2024年最新版)Ieee Transactions On Microwave Theory And Techniques Cite Score数据

  • CiteScore:8.6
  • SJR:1.633
  • SNIP:1.696
学科类别 分区 排名 百分位
大类:Physics and Astronomy 小类:Radiation Q1 4 / 58

93%

大类:Physics and Astronomy 小类:Condensed Matter Physics Q1 52 / 434

88%

大类:Physics and Astronomy 小类:Electrical and Electronic Engineering Q1 120 / 797

85%

CiteScore 是由Elsevier(爱思唯尔)推出的另一种评价期刊影响力的文献计量指标。反映出一家期刊近期发表论文的年篇均引用次数。CiteScore以Scopus数据库中收集的引文为基础,针对的是前四年发表的论文的引文。CiteScore的意义在于,它可以为学术界提供一种新的、更全面、更客观地评价期刊影响力的方法,而不仅仅是通过影响因子(IF)这一单一指标来评价。

历年Cite Score趋势图

中科院SCI分区Ieee Transactions On Microwave Theory And Techniques 中科院分区

中科院 2023年12月升级版 综述期刊:否 Top期刊:是
大类学科 分区 小类学科 分区
工程技术 1区 ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 2区

中科院分区表 是以客观数据为基础,运用科学计量学方法对国际、国内学术期刊依据影响力进行等级划分的期刊评价标准。它为我国科研、教育机构的管理人员、科研工作者提供了一份评价国际学术期刊影响力的参考数据,得到了全国各地高校、科研机构的广泛认可。

中科院分区表 将所有期刊按照一定指标划分为1区、2区、3区、4区四个层次,类似于“优、良、及格”等。最开始,这个分区只是为了方便图书管理及图书情报领域的研究和期刊评估。之后中科院分区逐步发展成为了一种评价学术期刊质量的重要工具。

历年中科院分区趋势图

JCR分区Ieee Transactions On Microwave Theory And Techniques JCR分区

2023-2024 年最新版
按JIF指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q2 94 / 352

73.4%

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q2 99 / 354

72.18%

JCR分区的优势在于它可以帮助读者对学术文献质量进行评估。不同学科的文章引用量可能存在较大的差异,此时单独依靠影响因子(IF)评价期刊的质量可能是存在一定问题的。因此,JCR将期刊按照学科门类和影响因子分为不同的分区,这样读者可以根据自己的研究领域和需求选择合适的期刊。

历年影响因子趋势图

发文数据

2023-2024 年国家/地区发文量统计
  • 国家/地区数量
  • CHINA MAINLAND442
  • USA413
  • Canada173
  • GERMANY (FED REP GER)119
  • Spain114
  • Italy93
  • South Korea72
  • France58
  • Taiwan58
  • Sweden52

本刊中国学者近年发表论文

  • 1、Three-Dimensional Interconnection With Magnetically Coupled Transition for W-Band Integration Applications

    Author: Sun, Jian Xu; Cheng, Yu Jian; Wang, Lei; Fan, Yong

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 1, pp. 112-121. DOI: 10.1109/TMTT.2022.3169138

  • 2、Accurate Detection of Doppler Cardiograms With a Parameterized Respiratory Filter Technique Using a K-Band Radar Sensor

    Author: Dong, Shuqin; Li, Yuchen; Lu, Jingyun; Zhang, Zhi; Gu, Changzhan; Mao, Junfa

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 1, pp. 71-82. DOI: 10.1109/TMTT.2022.3184019

  • 3、NSRR Microwave Sensor Based on PLL Technology for Glucose Detection

    Author: Fu, Xiaodong; Wu, Jiakang; Wang, Xiao; Gu, Xiaofeng; Wang, Cong; Wu, Yongle; Liang, Junge

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 763-772. DOI: 10.1109/TMTT.2022.3193696

  • 4、High-Efficiency and High-Current GaN-Based Microwave Rectifier for Wireless Strain Sensing and Monitoring

    Author: Liu, Tao; Li, Yang; Yang, Jia-Yi; Wang, Ting-Ting; Wang, Xiao; Yang, Lin-An; Dickey, Michael; Ao, Jin-Ping; Hao, Yue

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 898-906. DOI: 10.1109/TMTT.2022.3197407

  • 5、Memory Feature-Based Sample Selection Strategy for Few-Sample Learning Digital Predistortion

    Author: Yang, Guichen; Qiao, Wen; Jiang, Chengye; Su, Lei; Han, Renlong; Tan, Jingchao; Liu, Falin

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 602-612. DOI: 10.1109/TMTT.2022.3199482

  • 6、Higher Order CPML for Leapfrog Complying-Divergence Implicit FDTD Method and Its Numerical Properties

    Author: Liu, Shuo; Tan, Eng Leong; Zou, Bin; Zhang, Lamei

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 522-535. DOI: 10.1109/TMTT.2022.3199493

  • 7、Harmonic-Based Integrated Rectifier-Transmitter for Uncompromised Harvesting and Low-Power Uplink

    Author: Wu, Pengde; Gao, Si-Ping; Chen, Yi-Dan; Ren, Zhi Hua; Yu, Pengyu; Guo, Yongxin

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 870-880. DOI: 10.1109/TMTT.2022.3200101

  • 8、An Advanced Calibration Method for Probe Leakage Correction in On-Wafer Test Systems

    Author: Wang, Yibang; Fu, Xingchang; Wu, Aihua; Huo, Ye; Liu, Chen; Luan, Peng; Lei, Lihua; Liang, Faguo; Li, Chong

    Journal: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2023; Vol. 71, Issue 2, pp. 682-690. DOI: 10.1109/TMTT.2022.3200050

投稿常见问题

通讯方式:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141。